半导体行业专利对IEEE科技文献的引用情况


半导体行业专利对IEEE科技文献的引用量占到26%

半导体行业著名高科技企业对IEEE文献的引用情况

IEEE 关于半导体行业的文献资料

CMOS

97,500+ documents

RRAM/MRAM

7,500+ documents

Optoelectronics/OEIC applications

30,400+ documents

Semiconductor Lasers

25,700+ documents

Silicon Wafer

3,600+ documents

Carbon Nanotubes

7,800+ documents

3D IC

1,600+ documents

Graphene

4,000+ documents

IEEE 关于半导体行业的期刊

IEEE Transactions on Electron Devices
IEEE Photonics Technology Letters
IEEE Journal of Quantum Electronics
IEEE Transactions on Semiconductor Manufacturing
IEEE Solid-State Circuits Magazine
IEEE Journal of Solid-State Circuits

IEEE 关于半导体行业的会议举例

IEEE International Conference on Semiconductor Electronics
IEEE International Semiconductor Laser Conference
IEEE Semiconductor Thermal Measurement and Management Symposium
IEEE Symposium on Compound Semiconductor Integrated Circuit
IEEE Symposium on Semiconductor Thermal Measurement and Management
IEEE/SEMI Conference and Workshop Advanced Semiconductor Manufacturing
International Conference on Advanced Semiconductor Devices and Microsystems
International Conference on Advanced Thermal Processing of Semiconductors
International Conference on Semiconductor Laser and Photonics
International Semiconductor Conference
International Semiconductor Device Research Symposium
International Symposium on Power Semiconductor Devices and ICs
International Symposium on Semiconductor Device Research
International Symposium on Semiconductor Manufacturing

IEEE 关于半导体行业的标准举例

IEEE 592-2007  Standard for Exposed Semiconducting Shields on High-Voltage Cable Joints and Separable Connectors 
IEEE 1450.1-2005  Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450 /SUP TM/ 1999) for Semiconductor Design Environments 
IEC 62526 edition 1.0 2007  Standard for Extensions to Standard Test Interface Language (STIL) for Semiconductor Design Environments 
IEEE C57.18.10-1998  Standard Practices and Requirements for Semiconductor Power Rectifier Transformers 
IEEE C62.35-2010  Standard Test Methods for Avalanche Junction Semiconductor Surge-Protective Device Components 
N42.31-2003  American National Standard for Measurement Procedures for Resolution and Efficiency of Wide-Band Gap Semiconductor Detectors of Ionizing Radiation